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| Nr. No. | Autoren Authors | Titel Title | Zeitschrift Ausgabe (Jahr) Seiten Journal issue (year) pages |
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| 1 | M. Hoheisel R. Carius W. Fuhs | Low Temperature Photoconductivity in a-Si:H Films | Journal of Non-Crystalline Solids 59&60 (1983) 457-460 |
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| 2 | M. Hoheisel R. Carius W. Fuhs | Photoconductivity and Photoluminescence of a-Si:H at Low Temperature | Journal of Non-Crystalline Solids 63 (1984) 313-319 |
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| 3 | R. Carius W. Fuhs M. Hoheisel | Infrared Quenching of Photoluminescence and Photoconductivity in a-Si:H | Journal of Non-Crystalline Solids 66 (1984) 151-156 |
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| 4 | K. Kempter H. Wieczorek M. Hoheisel | Influence of Transparent Electrodes on Image Sensor Performance | Materials Research Society Symposium Proceedings 49 (1985) 429-434 |
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| 5 | M. Hoheisel H. Wieczorek K. Kempter | Characterization of Junctions between Transparent Electrodes and a-Si:H | Journal of Non-Crystalline Solids 77&78 (1985) 1413-1416 |
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| 6 | M. Hoheisel G. Brunst H. Wieczorek | Physical Aspects of a-Si:H Image Sensors | Journal of Non-Crystalline Solids 90 (1987) 243-246 |
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| 7 | M. Hoheisel N. Brutscher H. Oppolzer S. Schild | The Interfaces a-Si:H/Pd and a-Si:H/ITO: Structure and Electronic Properties | Journal of Non-Crystalline Solids 97&98 (1987) 959-962 |
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| 8 | N. Brutscher M. Hoheisel | Schottky Diodes with High Series Resistance: A Simple Method of Determining the Barrier Heights | Solid-State Electronics 31 (1988) 87-89 |
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| 9 | M. Hoheisel W. Fuhs | Drift Mobility in n- and p-Conducting a-Si:H | Philosophical Magazine B 57 (1988) 411-419 |
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| 10 | A. Mitwalsky M. Hoheisel W. Müller C. Mrotzek | Microstructure and Interface of Indium-Tin-Oxide Contacts on Hydrogenated Amorphous Silicon | Proceedings of the 9th European Conference on Electron Microscopy, York 1988, Inst. Phys. Conf. Ser. No. 93, 2 (1988) 107-108 |
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| 11 | M. Hoheisel N. Brutscher H. Wieczorek | Relaxation Phenomena of Image Sensors made from a-Si:H | Journal of Applied Physics 66 (1989) 4466-4473 |
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| 12 | M. Hoheisel N. Brutscher H. Wieczorek | Ambient-Induced Defect States at a-Si:H/ITO Interfaces | Journal of Non-Crystalline Solids 115 (1989) 114-116 |
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| 13 | M. Hoheisel S. Heller C. Mrotzek A. Mitwalsky | Anvanced Transparent Conductive Oxide Electrode for Optoelectronic Thin-Film Devices | Solid State Communications 76 (1989) 1-3 |
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| 14 | M. Hoheisel A. Mitwalsky C. Mrotzek | Microstructure and Etching Properties of Sputtered Indium-Tin Oxide (ITO) | physica status solidi (a) 123 (1991) 461-472 |
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| 15 | J. Kocka O. Klima G. Juska M. Hoheisel R. Plättner | SCLC Transients in a-Si:H - New Features and Possibilities | Journal of Non-Crystalline Solids 137&138 (1991) 427-430 |
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| 16 | M. Hoheisel O. Stika J. Kocka | Systematic Study of the Influence of Contacts on CPM Results | Journal of Non-Crystalline Solids 137&138 (1991) 615-618 |
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| 17 | M. Hoheisel E. Reichle H. Harms J. Kotschy | Temperature Dependence of the Photocurrent in pin and nip Solar Cell Structures made from a-Si:H | Journal of Non-Crystalline Solids 137&138 (1991) 1181-1184 |
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| 18 | J. Kocka O. Klima E. Sipek C. E. Nebel G. H. Bauer G. Juska M. Hoheisel | a-Si:H Electron Drift Mobility Measured under Extremely High Electric Field | Physical Review B 45 (1992) 6593-6600 |
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| 19 | G. Juska K. Arlauskas J. Kocka M. Hoheisel P. Chabloz | Hot Electrons in Amorphous Silicon | Physical Review Letters 75 (1995) 2984-2987 |
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| 20 | J. Chabbal C. Chaussat T. Ducourant L. Fritsch J. Michailos V. Spinnler G. Vieux M. Arques G. Hahm M. Hoheisel H. Horbaschek R. Schulz M. Spahn | Amorphous Silicon X-Ray Image Sensor | Proceedings of SPIE Symposium "Medical Imaging 1996" 10-15 Feb. 1996, Newport Beach USA, 2708 (1996) 499-510 |
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| 21 | M. Hoheisel M. Arques J. Chabbal C. Chaussat T. Ducourant L. Fritsch G. Hahm H. Horbaschek J. Michailos R. Schulz M. Spahn V. Spinnler G. Vieux | Amorphous Silicon X-Ray Detectors | Proceedings of the 9th International School on Condensed Matter Physics "Future Directions in Thin Film Science and Technology" 9 - 13 Sept. 1996, Varna Bulgaria, Ed. J. M. Marshall, N. Kirov, A. Vavrek, J. M. Maud (1996) 112-120 |
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| 22 | M. Hoheisel M. Arques J. Chabbal C. Chaussat T. Ducourant G. Hahm H. Horbaschek R. Schulz M. Spahn | Amorphous Silicon X-Ray Detectors | Journal of Non-Crystalline Solids 227&230 (1998) 1300-1305 |
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| 23 | M. Hoheisel L. Bätz | Requirements on amorphous semiconductors for medical X-Ray detectors | Journal of Non-Crystalline Solids 266&269 (2000) 1152-1157 |
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| 24 | M. Hoheisel L. Bätz | Requirements on amorphous semiconductors for medical X-Ray detectors | Thin Solid Films 383 (2001) 132-136 |
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| 25 | K.-F. G. Pfeiffer J. Giersch G. Anton L. Bätz M. Hoheisel | Large-scale images taken with the Medipix-1 chip | Nuclear Instruments and Methods in Physics Research A 509 (2003) 340-348 |
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| 26 | M. Hoheisel J. Giersch M. Mitschke P. Bernhardt | Absorbers for medical X-ray detectors with optimum spatial resolution: a simulation study | Proceedings of SPIE Symposium "Medical Imaging 2004" 5368 (2004) 386-395 |
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| 27 | M. Hoheisel J. Giersch P. Bernhardt | Intrinsic spatial resolution of semiconductor X-ray detectors: a simulation study | Nuclear Instruments and Methods in Physics Research A 531/1-2 (2004) 75-81 |
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| 28 | M. Hoheisel A. Korn J. Giersch | Influence of backscattering on the spatial resolution of semiconductor X-ray detectors | Nuclear Instruments and Methods in Physics Research A 546 (2005) 252-257 |
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| 29 | M. Hoheisel L. Bätz T. Mertelmeier J. Giersch A. Korn | Modulation transfer function of a selenium-based digital mammography system | IEEE Proceedings of the Nuclear Science Symposium, Medical Imaging Conference (2004) 3589-3593 |
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| 30 | A. Korn J. Giersch M. Hoheisel | Simulation of internal backscatter effects on MTF and SNR of pixelated photon-counting detectors | Proceedings of SPIE 5745 (2005) 292-298 |
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| 31 | P. Bernhardt L. Bätz E.-P. Rührnschopf M. Hoheisel | Spatial frequency-dependent signal-to-noise ratio as a generalized measure of image quality | Proceedings of SPIE 5745 (2005) 407-418 |
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| 32 | M. Hoheisel R. Lawaczeck H. Pietsch V. Arkadiev | Advantages of monochromatic X-rays for imaging | Proceedings of SPIE 5745 (2005) 1087-1095 |
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| 33 | M. Hoheisel P. Bernhardt R. Lawaczeck H. Pietsch | Comparison of polychromatic and monochromatic X-rays for imaging | Proceedings of SPIE 6142 (2006) 614209-1 - 614209-8 |
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| 34 | M. Hoheisel | Review of medical imaging with emphasis on X-ray detectors | Nuclear Instruments and Methods in Physics Research A 563 (2006) 215-224 |
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| 35 | M. Hoheisel L. Bätz T. Mertelmeier J. Giersch A. Korn | Modulation transfer function of a selenium-based digital mammography system | IEEE Transactions on Nuclear Science 53 (2006) 1118-1122 |
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| 36 | P. Bernhardt T. Mertelmeier M. Hoheisel | X-ray spectrum optimization of full-field digital mammography: Simulation and phantom study | Medical Physics 33 (2006) 4337-4349 |
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| 37 | M. Nagel M. Hoheisel R. Petzold W. A. Kalender U. H. W. Krause | Needle and catheter navigation using electromagnetic tracking for computer-assisted C-arm CT interventions | Proceedings of SPIE 6509 (2007) 65090J-1 - 65090J-9 |
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| 38 | B. C. Meyer M. H. Nagel O. Peter M. Witschel M. Hoheisel K. J. Wolf F. K. Wacker | Phantomstudie zum Einsatz eines elektromagnetischen Navigationssystems unter Verwendung angiographischer CT-Datensätze | Fortschritte auf dem Gebiet der Röntgenstrahlen und der bildgebenden Verfahren 179 (2007) VO_216_2 |
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| 39 | F. K. Wacker B. Meyer M. H. Nagel M. Hoheisel V. Trösken O. Peter K. J. Wolf | Rekanalisation von arteriellen Stenosen und Verschlüssen mithilfe von angiographischen CT-Datensätzen und einer magnetischen Katheter-Verfolgung | Fortschritte auf dem Gebiet der Röntgenstrahlen und der bildgebenden Verfahren 179 (2007) VO_317_8 |
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| 40 | M. Nagel M. Hoheisel U. Bill K. Klingenbeck-Regn W. A. Kalender R. Petzold | Electromagnetic tracking system for minimal invasive interventions using a C-arm system with CT option: First clinical results | Proceedings of SPIE 6918 (2008) 69180G-1 - 69180G-10 |
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| 41 | B. C. Meyer O. Peter M. Nagel M. Hoheisel B. B. Frericks K.-J. Wolf F. K. Wacker | Electromagnetic field-based navigation for percutaneous punctures on C-arm CT: experimental evaluation and clinical application | European Radiology 18 (2008) 2855-2864 |
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| 42 | N. Strobel O. Meissner J. Boese T. Brunner B. Heigl M. Hoheisel G. Lauritsch M. Nagel M. Pfister E.-P. Rührnschopf B. Scholz B. Schreiber M. Spahn M. Zellerhoff K. Klingenbeck-Regn | Imaging with flat-detector C-arm systems | Multislice CT, Editors: M. F. Reiser, C. R. Becker, K. Nicolaou, G. Glazer, Springer-Verlag (2008) 33-51 |
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| 43 | T. Donath F. Pfeiffer O. Bunk W. Groot M. Bednarzik C. Grünzweig E. Hempel S. Popescu M. Hoheisel C. David | Phase-contrast imaging and tomography at 60 keV using a conventional X-ray tube | Proceedings of SPIE 7078 (2008) 707817-1 - 707817-8 |
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| 44 | M. Hoheisel M. Skalej O. Beuing U. Bill K. Klingenbeck-Regn R. Petzold M. H. Nagel | Kyphoplasty interventions using a navigation system and C-arm CT data: first clinical results | Proceedings of SPIE 7258 (2009) 72580E-1 - 72580E-8 |
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| 45 | T. Donath F. Pfeiffer O. Bunk W. Groot M. Bednarzik C. Grünzweig E. Hempel S. Popescu M. Hoheisel C. David | Phase-contrast imaging and tomography at 60 keV using a conventional X-ray tube source | Review of Scientific Instruments 80 (2009) 053701-1 - 053701-4 |
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| 46 | T. Donath M. Chabior F. Pfeiffer O. Bunk E. Reznikova J. Mohr E. Hempel S. Popescu M. Hoheisel M. Schuster J. Baumann C. David | Inverse geometry for grating-based X-ray phase-contrast imaging | Journal of Applied Physics 106 (2009) 054703-1 - 054703-7 |
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| 47 | N. Blanc P. Giffard P. Seitz P. Buchschacher V. Nguyen M. Hoheisel | Semiconductor image sensing | More than Moore / Creating High Value Micro/Nanoelectronics Systems, Editors: G. Q. Zhang, A. J. van Roosmalen, Springer-Verlag (2009) 65-112 |
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| 48 | Y. Lu M. Berger M. Manhart J. Choi M. Hoheisel M. Kowarschik R. Fahrig Q. Ren J. Hornegger A. Maier | Bridge to real data: Empirical multiple material calibration for learning-based material decomposition | IEEE 13th International Symposium on Biomedical Imaging (ISBI) (2016) 457-460 |
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© M.Hoheisel